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Posts Tagged ‘afm’

Measuring adhesion in 2D materials with AFM

Measuring Adhesion in 2D Materials with AFM

A scientific paper has been published in Advanced Materials about studying adhesion in 2D materials with AFM, using the Bruker MultiMode 8.

Bruker AFM Contact Resonance Module

New Bruker BioAFM Contact Resonance Module for Stiff Biological Samples

Bruker’s Contact Resonance module is for mechanical characterisation of stiff biological samples, polymers and metals with AFM (Atomic Force Microscopy). Until now it was not possible to study the nanomechanical properties of samples such as teeth, bones, seeds, wood and medical implants with this level of accuracy.

Bruker Ringing Mode AFM

Bruker Ringing Mode for Surface Adhesion Property Mapping with AFM

Ringing Mode is a new Bruker AFM mode for enhanced surface adhesion property mapping.

Bruker JPK BioAFM SECM

New SECM (Scanning Electrochemical Microscopy) Option for Bruker JPK BioAFM

A new Scanning Electrochemistry option is available for the Bruker JPK NanoWizard BioAFM series. AFM-based SECM is used for electrochemical mapping at nanoscale resolution.

AFM in Virus Research

AFM in Virus Research

How Atomic Force Microscopy can be used in virology, including measuring biomechanical properties and virus-cell receptor interactions.

DNA metastable bubble formation and closure, taken with the Bruker JPK NanoRacer

New Bruker JPK NanoRacer AFM for Single Molecule Applications

The Bruker JPK NanoRacer is a biological AFM (Atomic Force Microscope) with speeds of up to 50 frames per second for studying dynamic biological processes in real time.

GaN Nanowire Defects

Studying Defect Formation in GaN Structures with AFM

Lund University in Sweden recently published two scientific papers about studying defects in GaN nanowires and structures, using AFM and various complementary techniques.

Online Training from Bruker Nano

Online Training from Bruker Nano: AFM, Tribology, Nanoindentation and more

Join Bruker for a series of free online training sessions over the next few weeks, covering nanoscale surface analysis topic.

Renishaw Correlate Software

Combine Raman with other Microscopy Techniques (SEM, AFM, IR & more)

With Renishaw’s new Correlate software module, you can combine results from various microscopy techniques for more powerful data.

PeakForce Tapping with Bruker AFM Microscopy

Bruker’s PeakForce Tapping AFM Mode in >4,000 Publications

Celebrating the 10th anniversary of PeakForce Tapping, the fastest growing AFM mode.