New Super Sharp AFM Probes from Bruker
Bruker has launched a range of super sharp AFM probes for imaging in air and fluid at higher resolution, delicate samples and enhanced nanoelectrical and nanomechnical characterisation.
Blue Scientific is the official distributor for Bruker AFM in the Nordic region (Denmark, Iceland, Norway, Sweden and Finland). If you have any questions, please get in touch.
Bruker Atomic Force Microscopes
Contact us on +44 (0)1223 422 269 or info@blue-scientific.com
1) Ultimate Resolution in Air
New Super Sharp 1nm Radius Probes
Resolve 1nm features with SCANASYST-AIR-HPI-SS probes. Reliable imaging in air at the highest resolution on a wide range of samples, including highly reflective materials.
- Compatible with any Bruker AFM with PeakForce Tapping.
- Resonant frequency 55 kHz in air.
- Mid range spring constant (0.25 N/m).
Full specification and online ordering
Glass at 1 nm resolution.
2) Soft and Delicate Samples
Highest Resolution on Challenging Materials
New super sharp probe for the highest resolution on soft and delicate samples, where it is important to preserve tip and sample integrity. PEAKFORCE-HIRS-SSB probes are optimised for PeakForce modes in air and fluid.
- Compatible with any Bruker AFM with PeakForce Tapping.
- Lower 0.12N/m spring constant.
- Resonant frequency 100KHz in air, 30kHz in liquid.
- 1 nm end radius.
Full specification and online ordering
300 nm image showing carbon nanotubes aligned with the crystalline structure of a quartz substrate. Acquired on a Dimension Icon using PeakForce Tapping, with PEAKFORCE-HIRS-SSB probes.
3) Electrical and Nanomechanical
Sharp Conductive Single Crystal Diamond Probes
Highly conductive, wear resistant Apex Sharp diamond probes patented by Adama Innovations, suitable for these methods:
- Conductive AFM
- Kelvin probe
- Scanning capacitance
- Piezo response
- Nanomechanical (high load nanoindentation and scratch)
The new probes are sharper and last longer than any other electrical AFM probes. The contact size is well characterised, with wear-resistant sharp diamond that stays constant during mechanical measurements. They have been proven to deliver quantitative and repeatable measurements for over 24 hours of continuous use.
Laser beam reflectance is enhanced by a gold reflex coating deposited on the detector side of the cantilever.
Available with various tip radii and spring constants to suit your application.
Full specification and online ordering
Piezoresponse Force Microscopy (PFM) images acquired during long-term continuous scanning of a 10×10 μm area in contact mode using a Bruker Dimension Icon. Piezo-electric domains in the LiTaO3 film can be distinguished with good contrast. No degradation in performance (contrast and spatial resolution).
AFM Probes for all Applications
AFM probes are available for all applications and budgets. Details of the full range are available on the Bruker AFM probes website.
- ValueLine – Low cost AFM range
- Tapping Mode / Non-contact probes
- PeakForce Tapping probes
- Contact Mode
If you need any advice, we’re available to help with your questions – just get in touch on +44 (0)1223 422 269 or info@blue-scientific.com
