Posts Tagged ‘bruker afm’

A scientific paper has been published in Advanced Materials about studying adhesion in 2D materials with AFM, using the Bruker MultiMode 8.

Ringing Mode is a new Bruker AFM mode for enhanced surface adhesion property mapping.

A new Scanning Electrochemistry option is available for the Bruker JPK NanoWizard BioAFM series. AFM-based SECM is used for electrochemical mapping at nanoscale resolution.

Celebrating the 10th anniversary of PeakForce Tapping, the fastest growing AFM mode.

An overview of how Atomic Force Microscopy can be used in battery research.

Join us for a two day conference in Copenhagen about AFM and nanoscale IR spectroscopy (AFM-IR, s-SNOM and O-PTIR).

The Bruker JPK NanoWizard 4 XP is a new, high resolution, large format biological AFM system

How Bruker have accelerated AFM without compromising image quality – with examples of screening, dynamics and surveying an overview of your sample.

We’re now the official service partner for Bruker in the Nordic region, for their X-Ray Analysis and Nano Surface Analysis product lines. In line with this agreement, we’ve expanded with a team of service engineers based regionally across the Nordic countries.  Bruker X-Ray Analysis  Bruker Nano Surface Analysis  Contact us on +44 (0)1223 422 269 […]

Bruker NanoElectrical Lab is a package of nanoelectrical AFM techniques, with new DataCube modes. Complete materials characterisation & simultaneous acquisition of mechanical & electrical data. Official Nordic distributor.