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Posts Tagged ‘defect analysis’

Identifying defects in polymers

Characterising Glass Fibre-Reinforced Polymers and Composite Materials with SEM-EDS

SEM-EDS can be used to characterise the composition of polymer composites. This is useful in failure analysis, to detect and identify contaminants and defects, and to check homogeneity.

Thermo Fisher Scientific

New Partner: Thermo Fisher Scientific SEM

We’re proud to announce a new partnership with Thermo Fisher Scientific as official distributor of the Axia ChemiSEM scanning electron microscope in the UK and Ireland.

Silicon Wafer Defects

Characterising Semiconductors with Raman Spectroscopy

How Raman spectroscopy can be used to characterise semiconductor materials. Measure defects in SiC, crystal quality, stress/strain, homogeneity and more.

Silicon Wafer Contamination

Identifying Contaminants on Semiconductors with Nanoscale IR Spectroscopy

Unambiguously identify organic contamination on silicon wafers and micro-electronics with a AFM-IR technique, using the Bruker Anasys nanoIR3.

Powder Metallurgy

Analytical Techniques for Powder Metallurgy in Manufacturing: XRD, XRF & Micro-CT

Analytical techniques for process control of manufacturing involving metal powders. How XRD, XRF and micro-CT are used for failure analysis, element composition and mapping, crystalline phase identification, parts inspection and more.