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Posts Tagged ‘materials’

Identifying defects in polymers

Characterising Glass Fibre-Reinforced Polymers and Composite Materials with SEM-EDS

SEM-EDS can be used to characterise the composition of polymer composites. This is useful in failure analysis, to detect and identify contaminants and defects, and to check homogeneity.

Nanosclae FTIR and s-SNOM

Advanced 2D Materials Research with Nanoscale FTIR and s-SNOM

A scientific paper published by UNSW highlighting new implications for engineered nanophotonics, using nanoscale FTIR and s-SNOM chemical imaging.

Advanced Materials Show 2020

The Advanced Materials Show, Stoneleigh (Postponed to 2-3 December 2020)

The Advanced Materials Show has been postponed to 2-3 December 2020 at NAEC Stoneleigh in Coventry (free to attend).

Silicon Wafer Defects

Characterising Semiconductors with Raman Spectroscopy

How Raman spectroscopy can be used to characterise semiconductor materials. Measure defects in SiC, crystal quality, stress/strain, homogeneity and more.

In-Situ EELS in a TEM

Characterising Material Dynamics with In-Situ EELS (Electron Energy-Loss Spectroscopy)

Study changes in composition and the electronic structure at the nanoscale with in-situ EELS in your TEM.

Infrared on Thin Films

Characterising Multilayer Films with IR Spectroscopy at Sub-micron Resolution

How to characterise multilayer films at sub-micron resolution with infrared, using O-PTIR spectroscopy.

Identifying Microplastics with Raman Spectroscopy

Microplastics Analysis with Raman Spectroscopy

How to analyse microplastic particles with Raman spectroscopy. Identify polymers and measure size, shape and composition with the Renishaw Invia Raman microscope.

3D Printing Live

3D Printing Live 2018: Nordic Additive Manufacturing Show – 31 May, Copenhagen

Visit our booth at the Nordic Additive Manufacturing Show in Copenhagen.

SBEM - Serial Block-Face Imaging

What is Serial Block-Face Imaging?

Serial block-face imaging is a 3D imaging technique for life science and materials. How it works, advantages of the technique, applications and example images.

Bruker D8 DISCOVER Plus

New Bruker D8 DISCOVER Plus XRD

New flagship of the Bruker XRD range, with powerful components for materials research and analysis.