Advanced 2D Materials Research with Nanoscale FTIR and s-SNOM
A scientific paper published by UNSW highlighting new implications for engineered nanophotonics, using nanoscale FTIR and s-SNOM chemical imaging.
A scientific paper published by UNSW highlighting new implications for engineered nanophotonics, using nanoscale FTIR and s-SNOM chemical imaging.
The Advanced Materials Show has been postponed to 2-3 December 2020 at NAEC Stoneleigh in Coventry (free to attend).
How Raman spectroscopy can be used to characterise semiconductor materials. Measure defects in SiC, crystal quality, stress/strain, homogeneity and more.
How to characterise multilayer films at sub-micron resolution with infrared, using O-PTIR spectroscopy.
How to analyse microplastic particles with Raman spectroscopy. Identify polymers and measure size, shape and composition with the Renishaw Invia Raman microscope.
Visit our booth at the Nordic Additive Manufacturing Show in Copenhagen.
New flagship of the Bruker XRD range, with powerful components for materials research and analysis.
Visit us at Imperial College London at the Department of Materials Postdoctoral Symposium on Friday 8th September 2017. [icon icon=”info”] View
4D micro-CT (Micro-Computed Tomography or 3D X-ray imaging) involves imaging dynamic processes over time. This article explains step-by-step time-lapse and real-time
Visit us at ASMCS 2016, the Annual Surface and Materials Chemistry Symposium on 8-10 November 2016 in Gothenburg, Sweden.
How to analyse individual and multiple fibres in natural and synthetic materials using micro-CT imaging.
Dow Fellow Dr Gregory Meyers will present an invited talk about AFM based nanoscale IR spectroscopy on polymer blends and