Posts Tagged ‘spm’

Nanomechanical testing with in situ SPM imaging, using the same probe to ensure test positioning accuracy and correlated results.

Visit us at MMC 2017 Microscience Microscopy Congress on 3-6 July 2017 at Manchester Central.

Combined Raman-SPM / AFM instruments are now available in the Nordic region (Sweden, Finland, Norway and Denmark) with our new partnership with Renishaw.

Visit us at the Scanning Probe Microscopy Meeting 2016 on 6-7 July 2016 at the University of Warwick.

Come to our AFM workshop on Thursday 17th March 2016 at DFM (Danish National Metrology Institute) in Denmark.