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Bruker D8 DISCOVER Plus
Bruker AXS

The Bruker D8 DISCOVER Plus is the flagship of the Bruker XRD (X-Ray Diffraction) range.

Setting a new standard for XRD, with faster collection of higher quality data for all applications, from classic powder diffraction to epitaxial thin film characterisation.



Unmatched capabilities

Flagship of the XRD range. Unrivalled accuracy and reliability.

Various configurations

Multipurpose and dedicated models.

Flexible system

Compatible with a range of components.

Guaranteed alignment

Each instrument is individually checked and verified.


  • 6kw TXS-HE Turbo X-Ray Source – Highly powerful, efficient and reliable source for line and spot focus applications.
  • ATLAS goniometer – High endurance and unrivalled, guaranteed angular accuracy.
  • Non-coplanar arm for in-plane diffraction measurements with exceptional accuracy – more info…
  • IµS microfocus X-ray source with new MONTELPlus optics for mm sized samples.

Turbo X-ray Source

Extra signal is always an advantage in X-ray Diffraction, for better data quality, signal-to-noise and sample throughput.

The TXS-HE High Efficiency Turbo X-ray Source boosts signal while minimising the maintenance associated with rotating anode technology.

  • Up to 5 times the intensity of an industrial sealed tube
  • Unsurpassed focal spot brightness
  • Maximum intensity, with the perfect configuration of optics
  • Minimal air scatter, with a reduced beam path length

ATLAS Goniometer

The goniometer is key to accurate sample analysis. The ATLAS goniometer features precise orientation of components for the highest accuracy during measurement:

  • High-precision stepper motors with high resolution optical encoders
  • Precise, software monitored component interface
  • Robust and maintenance-free

In Plane Diffraction

Equip the D8 DISCOVER Plus with the non-coplanar arm and MONTEL Plus X-ray optics for the highest intensity for in plane diffraction. More info…


The new system is compatible with the full range of D8 DISCOVER components including:

  • Optics – Optimal beam conditions for every experiment, with multi-beampath optics.
  • Stages – Including multi position sample changers, centric Eulerian cradles and UMC stages for heavy loads.
  • Detectors – Multi-mode detectors for all XRD applications, including Bruker’s LYNXEYE XE-T and EIGER2 R 500K.
  • Accessories


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