Characterising Semiconductors with Raman Spectroscopy
How Raman spectroscopy can be used to characterise semiconductor materials. Measure defects in SiC, crystal quality, stress/strain, homogeneity and more.
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material characterisation
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Combining Raman Spectroscopy and Nanoindentation
How to combine Raman and nanoindentation for correlated mechanical and chemical data, delivering insights into your material’s properties.
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Characterise Semiconductor Materials with Nanoscale IR
How nanoscale infrared spectroscopy can be used to measure semiconductor materials in defect and contamination analysis, and fabrication.
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Electrical AFM Techniques – Bruker NanoElectrical Lab
Bruker NanoElectrical Lab is a package of nanoelectrical AFM techniques, with new DataCube modes. Complete materials characterisation & simultaneous acquisition of mechanical & electrical data. Official Nordic distributor.
