+44 (0)1223 422 269 Contact

Posts Tagged ‘material characterisation’

Silicon Wafer Defects

Characterising Semiconductors with Raman Spectroscopy

How Raman spectroscopy can be used to characterise semiconductor materials. Measure defects in SiC, crystal quality, stress/strain, homogeneity and more.

Analysing Semiconductors with Nanoscale IR Spectroscopy

Characterise Semiconductor Materials with Nanoscale IR

How nanoscale infrared spectroscopy can be used to measure semiconductor materials in defect and contamination analysis, and fabrication.

Combining Indentation & Raman

Combining Raman Spectroscopy and Nanoindentation

How to combine Raman and nanoindentation for correlated mechanical and chemical data, delivering insights into your material’s properties.

Cathodoluminescence Image

What is Cathodoluminescence? Plus how to add it to your SEM/TEM/STEM

Cathodoluminescence (CL) is a technique for characterising composition, optical and electronic properties with data that correlates with morphology, micro-structure, composition and chemistry at the nanoscale.

Bruker NanoElectrical Lab

Electrical AFM Techniques – Bruker NanoElectrical Lab

Bruker NanoElectrical Lab is a package of nanoelectrical AFM techniques, with new DataCube modes. Complete materials characterisation & simultaneous acquisition of mechanical & electrical data. Official Nordic distributor.