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Posts Tagged ‘spectroscopy’

Silicon Wafer Contamination

Identifying Contaminants on Semiconductors with Nanoscale IR Spectroscopy

Unambiguously identify organic contamination on silicon wafers and micro-electronics with a AFM-IR technique, using the Bruker Anasys nanoIR3.

Renishaw Raman-SPM & Raman-AFM

Official Distributor for Renishaw Raman – SPM / AFM in Norway, Denmark, Sweden and Finland

Combined Raman-SPM / AFM instruments are now available in the Nordic region (Sweden, Finland, Norway and Denmark) with our new partnership with Renishaw.

What is AFM-IR Video

AFM-IR Video: Anasys nanoIR2

AFM-IR Video AFM-IR is a pioneering nanoscale surface analysis technique that combines AFM (atomic force microscopy) with infrared (IR) spectroscopy. Watch the AFM-IR video from Anasys for an easy-to-understand, visual explanation of what AFM-IR is and how the technique captures spectra alongside AFM-IR images. nanoIR2™ AFM-IR System The Anasys nanoIR2 is a nanoscale IR spectroscopy platform. The system features […]

AFM-IR Webinar - nanoscale IR spectroscopy for materials and life science

AFM-IR Webinar, 21st October: Nanoscale IR Spectroscopy for Materials and Life Science

AFM-IR webinar about nanoscale IR spectroscopy for materials and life science, presented by Anasys Instruments on Tuesday 21st October at 8am PST (4pm GMT). Learn about revolutionary AFM-IR surface analysis technique and why it is being adopted as the new method of choice for nanoscale chemical identification and composition mapping. With sub-50nm spatial resolution, AFM-IR is an entirely […]