Identifying Contaminants on Semiconductors with Nanoscale IR Spectroscopy
Unambiguously identify organic contamination on silicon wafers and micro-electronics with a AFM-IR technique, using the Bruker Anasys nanoIR3.
News
spectroscopy
News
Official Distributor for Renishaw Raman – SPM / AFM in Norway, Denmark, Sweden and Finland
Combined Raman-SPM / AFM instruments are now available in the Nordic region (Sweden, Finland, Norway and Denmark) with our new partnership with Renishaw.
News
AFM-IR Video: Anasys nanoIR2
AFM-IR Video AFM-IR is a pioneering nanoscale surface analysis technique that combines AFM (atomic force microscopy) with infrared (IR) spectroscopy.
Events
AFM-IR Webinar, 21st October: Nanoscale IR Spectroscopy for Materials and Life Science
AFM-IR webinar about nanoscale IR spectroscopy for materials and life science, presented by Anasys Instruments on Tuesday 21st October at
