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Posts Tagged ‘electronics’

UWBG Semiconductor Defects

Analysing Ultra-Wide Bandgap (UWBG) Semiconductors with Cathodoluminescence (CL)

Map defect distribution and variations for process development of materials for electronic / optoelectronic devices. CL is ideal for materials not suitable for photoluminescence spectroscopy.

SiGE Semiconductor Characterisation

A New Method for Characterising Nanometre-Sized Semiconductor Structures

Self-focusing SIMS is a new technique for measuring the composition of semiconductors and SiGE devices. It’s ten times faster than studying nanometre-scale features directly with methods such as TEM or APT.

Silicon Wafer Defects

Characterising Semiconductors with Raman Spectroscopy

How Raman spectroscopy can be used to characterise semiconductor materials. Measure defects in SiC, crystal quality, stress/strain, homogeneity and more.

Silicon Wafer Contamination

Identifying Contaminants on Semiconductors with Nanoscale IR Spectroscopy

Unambiguously identify organic contamination on silicon wafers and micro-electronics with a AFM-IR technique, using the Bruker Anasys nanoIR3.

Analysing Geological Samples with WDXRF

Analysing Elemental Distribution in Rocks with XRF (Coltan)

How to analyse elemental distribution in rocks with XRF. In this case study we look at columbite-tantalite (coltan) in rocks from Canada, with the Bruker S8 TIGER Series 2 WDXRF spectrometer. Blue Scientific is the official distributor for Bruker XRF in the Nordic region (Norway, Sweden, Denmark, Finland, Iceland). For more information or quotes, please get in […]

Bruker Contour LS-K

Fastest Ever 3D Optical Profiling with Bruker LightSpeed™ Focus Variation

New Bruker Contour LS-K 3D optical profiler for fast, high quality surface maps and metrology data, with new technology for focus variation on samples with topography.