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Posts Tagged ‘materials science’

Identifying defects in polymers

Characterising Glass Fibre-Reinforced Polymers and Composite Materials with SEM-EDS

SEM-EDS can be used to characterise the composition of polymer composites. This is useful in failure analysis, to detect and identify contaminants and defects, and to check homogeneity.

Thermo Fisher Scientific

New Partner: Thermo Fisher Scientific SEM

We’re proud to announce a new partnership with Thermo Fisher Scientific as official distributor of the Axia ChemiSEM scanning electron microscope in the UK and Ireland.

Gatan Stela 4D STEM

Gatan Stela Hybrid-Pixel Camera for 4D STEM

The Gatan Stela hybrid-pixel camera is a complete system for 4D STEM (4D Scanning Transmission Electron Microscopy).

Renishaw Raman Spectrum Search

Renishaw Spectrum Search: Easily Identify Materials in a Mixture with Raman Spectroscopy

Renishaw’s Spectrum Search is a new software feature that automates the process of identifying components within a mixture with Raman spectroscopy.

Nanosclae FTIR and s-SNOM

Advanced 2D Materials Research with Nanoscale FTIR and s-SNOM

A scientific paper published by UNSW highlighting new implications for engineered nanophotonics, using nanoscale FTIR and s-SNOM chemical imaging.

Combining Indentation & Raman

Combining Raman Spectroscopy and Nanoindentation

How to combine Raman and nanoindentation for correlated mechanical and chemical data, delivering insights into your material’s properties.

Coatings Analysis with Raman

Characterise Coatings with Raman Microscopy

How to analyse layers and coatings with Raman spectroscopy, with the example of paint on coated metal.

Cathodoluminescence Image

What is Cathodoluminescence? Plus how to add it to your SEM/TEM/STEM

Cathodoluminescence (CL) is a technique for characterising composition, optical and electronic properties with data that correlates with morphology, micro-structure, composition and chemistry at the nanoscale.

In-Situ EELS in a TEM

Characterising Material Dynamics with In-Situ EELS (Electron Energy-Loss Spectroscopy)

Study changes in composition and the electronic structure at the nanoscale with in-situ EELS in your TEM.

Bruker S6 JAGUAR Benchtop WDXRF

New Bruker S6 JAGUAR Benchtop WDXRF for Elemental Analysis

The Bruker S6 JAGUAR is a new benchtop Wavelength Dispersive X-Ray Fluorescence spectrometer for elemental analysis in materials research and quality control.