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Posts Tagged ‘renishaw’

Empty modelling with Raman

Empty Modelling in Raman Analysis

Empty modelling identifies components and unknown materials from complex mixtures, even without knowledge of the species present.

Renishaw Raman Particle Analysis

Automated Particle Analysis with Raman Spectroscopy

A new software module for automated particle analysis with Raman spectroscopy from Renishaw. The process is automated, making it easy to sort, filter and identify particles of interest in a variety of fields, including microplastics, forensics, pharmaceuticals, 2D materials and more. Blue Scientific is the official distributor for Renishaw Raman in Norway, Sweden, Denmark, Finland […]

Renishaw Raman Spectrum Search

Renishaw Spectrum Search: Easily Identify Materials in a Mixture with Raman Spectroscopy

Renishaw’s Spectrum Search is a new software feature that automates the process of identifying components within a mixture with Raman spectroscopy.

Renishaw InVia InSpect

Renishaw InVia InSpect: Raman Microscope for Forensic Trace Analysis

The Renishaw inVia InSpect is a new version of Renishaw’s inVia confocal Raman microscope, optimised specifically for use in forensic laboratories for trace chemical analysis.

Renishaw Correlate Software

Combine Raman with other Microscopy Techniques (SEM, AFM, IR & more)

With Renishaw’s new Correlate software module, you can combine results from various microscopy techniques for more powerful data.

Studying Graphitisation with Raman

Studying Graphitisation and Graphite Crystallinity with Raman Spectroscopy

How the Geological Survey of Finland (GTK) used Raman spectroscopy to study graphitisation temperature and measure graphite crystallinity, relevant to battery development.

Renishaw Virsa Raman Analyser

New Renishaw Virsa Raman Analyser

The Renishaw Virsa Raman Analyser has probes for remote analysis, so you can measure samples outside your microscope and the lab.

Silicon Wafer Defects

Characterising Semiconductors with Raman Spectroscopy

How Raman spectroscopy can be used to characterise semiconductor materials. Measure defects in SiC, crystal quality, stress/strain, homogeneity and more.

Combining Indentation & Raman

Combining Raman Spectroscopy and Nanoindentation

How to combine Raman and nanoindentation for correlated mechanical and chemical data, delivering insights into your material’s properties.

Raman Imaging Solar Cells & Photovoltaics

Characterising Photovoltaics and Solar Cells with Raman Spectroscopy

How Raman spectroscopy is used in the development of photovoltaics and solar cells.