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How to measure individual grains with Micro-CT

How to Measure Individual Grains/Particles/Fibres with Micro-CT

Using Bruker’s watershed algorithm to separate grain-based materials with X-ray micro-CT – ideal for powders, fibres, geological samples, pharmaceuticals and more.

Bruker Anasys nanoIR3-s Broadband

New Bruker nanoIR3-s Broadband Nanoscale IR and SNOM/AFM Microscopy System

The Bruker nanoIR3-s Broadband is the most advanced s-SNOM based nanoscale FTIR spectroscopy system available, with the broadest spectral range, high resolution nanochemical and nano-optical imaging capabilities.

Upgrade your TEM Camera

Upgrading your TEM: Cameras and Cryo-EM

Upgrading your TEM camera can update your existing microscope for higher quality data, faster and easier workflows and convenient new features.

Bruker XRD Non-Coplanar Arm

High-Intensity In-Plane Diffraction with the Bruker D8 DISCOVER Plus XRD

Acquire the best quality data with the highest intensity, with a new non-coplanar arm and X-ray optics for the Bruker D8 DISCOVER Plus XRD.

Bruker JPK NanoWizard 4 BioAFM

Bruker JPK NanoWizard 4 XP: High Resolution, Large Format Bio-AFM

The Bruker JPK NanoWizard 4 XP is a new, high resolution, large format biological AFM system

Cryo-EM in Structural Biology

Cryo-EM in Structural Biology

How cryo-EM is used in structural biology to solve structures at resolutions not possible just a few years ago.

Bone Research Society Meeting 2019

BRS Annual Meeting 2019 (Bone Research Society)

Visit us at the BRS Annual Meeting 2019 on 4-6 September 2019 at Cardiff University. Annual meeting of the Bone Research Society and the British Orthopaedic Research Society.

TOSCA 2019

ToScA 2019: Tomography for Scientific Advancement Symposium

Visit us at ToScA 2019 tomography conference on 11-13 September 2019 at the University of Southampton.

Gatan K3 IS Electron Counting TEM Camera

Low Dose Electron Microscopy (TEM) for Beam-Sensitive Materials

How to use low dose TEM to study beam-sensitive materials with reduced damage, using new electron counting camera technology.

Automated Cross-Sections with the Gatan PECS II

Automated Cross-Sections, Polishing and Delayering for SEM / Optical Microscopy

Prepare high quality samples for SEM, EDS, EBSD, cathodoluminescence, EBIC and more with the Gatan PECS II broad argon beam system.