Bruker AFM Workshop at Nanoscience Days 2017 – 04/10/17
Come to our Bruker AFM Workshop at Nanoscience Days 2017 in Jyväskylä, Finland.
Come to our Bruker AFM Workshop at Nanoscience Days 2017 in Jyväskylä, Finland.
Bruker has launched a range of super sharp AFM probes for imaging in air and fluid at higher resolution, delicate
Save the date for our Nordic AFM User Meeting on Tuesday 26th September at Max IV in Sweden!
A paper has been published about imaging plant cell walls to analyse cellular structure and microfibril orientation. Atomic Force Microscopy is a useful tool in the paper and pulp industry.
PeakForce SECM is a new AFM mode for Bruker Dimension Icon Atomic Force Microscopes. Perform scanning electrochemical microscopy and in-situ electrical mapping in liquids.
Bruker webinar about Peakforce SECM (Scanning Electrochemical Microscopy), a new AFM mode with less than 100 nanometre spacial resolution.