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Posts Tagged ‘hysitron’

Semiconductor wafer

Characterising CMP Pads with Nanoindentation

How to use dynamic nanoindentation characterise CMP pads. In this example, the Bruker Hysitron TS 77 Select was employed to quantitatively measure the viscoelastic properties of a hard pad.

This is a robust, reliable method for examining CMP pad surface quality and processes.

Scientific Nanoscale Analysis Podcast

“Solutions for NanoAnalysis” Podcast

A new nanoanalysis podcast from Bruker, with special guests from all areas of nanoscale analysis including micro-XRF, TXRF, nanomechanical testing, TEM/SEM and more.

In-Situ Material Deformation Testing

In-Situ Nanomechanical Test System for Analysing Material Deformation in SEM

The new Bruker Hysitron PI 89 SEM PicoIndenter is an in-situ nanomechanical testing system for electron microscopes, for analysing deformation of high-strength materials.

Combining Indentation & Raman

Combining Raman Spectroscopy and Nanoindentation

How to combine Raman and nanoindentation for correlated mechanical and chemical data, delivering insights into your material’s properties.

In-Situ Compression Testing

Webinar: In-Situ Nanomechanics in the Transmission Electron Microscope (TEM) 18/10/18

Join Bruker for a webinar on 18 October 2018 about in-situ nanomechanical testing in the TEM, including how to observe materials under stress at the nanoscale.

In-situ Nanomechanical Testing

In-Situ Nanomechanical Testing Modes for SEM / TEM

Round-up of in-situ nanomechanical testing modes for SEM and TEM microscopes, including compression, tensile, bend, electrical characterisation, heating and more.

Nanomechanical Testing with In Situ SPM

In Situ SPM for Nanomechanical and Nanotribological Characterisation

Nanomechanical testing with in situ SPM imaging, using the same probe to ensure test positioning accuracy and correlated results.

Nanomechanical Characterisation of Thin Films

Nanomechanical Characterisation of Thin Films

Traditional material characterisation techniques (eg tensile testing) are not always reliable at the nanoscale. True nanoscale sensitivity and the capacity for quantitative analysis are key to understanding the structure and properties of nanoscale components. The Hysitron TI 950 TriboIndenter equipped with the performech™ advanced control module delivers the force and displacement sensitivity necesary for testing materials and structures with nanoscale […]

In-Situ SEM

Try out In-Situ SEM Nanoindentation – 28-29 May, Birmingham

Discover more about in-situ SEM (Scanning Electron Microscope) nanomechanical testing with a personal in-situ SEM nanoindentation demonstration. The demos will be held at the University of Birmingham on 28 and 29 May, after the MidSEM (Midlands SEM) meeting. Contact us to book your session now. Personal In-Situ SEM Nanoindentation Demonstrations Pairing the high sensitivity of nanomechanical testing with the high […]

High temperature SEM indentation

High Temperature In-Situ Mechanical Testing

High temperature in-situ mechanical testing, using a Hysitron PI series SEM PicoIndenter. A study of indentation on silicon at extreme temperatures.  Contact us View our scientific instruments SEM PicoIndenter The Hysitron PI Series SEM PicoIndenter is a depth-sensing mechanical test system designed to interface with a wide range of scanning electron microscopes (SEM). They uniquely couple the ability to acquire quantitative nano-mechanical […]